The SU3500 Scanning Electron Microscope features innovative electron optics and signal detection systems to provide unparalleled imaging and analytical performance. Designed with intuitive logic, the new user-friendly GUI provides comprehensive image observation and display functions. Engineered for a wide range of applications including biological specimens and advanced materials, the SU3500 is sure to be the workhorse microscope in any laboratory.
Unparalleled Image Quality
All new electron optics design with best-in-class image sharpness. 7 nm SE Image Resolution at 3 kV, 10 nm BSE Image resolution at 5 kV.
Wide-screen GUI and fast auto image optimization functions (7 seconds) via "delegation" technology.
Ultra Variable-Pressure Detector
Image surface information at low vacuum and low accelerating voltages.
Stereoscopic Image Function
Point and click for seamless, real-time "3D" image observation.
New Gun Bias System and Image Signal Processing allows quick and easy focus adjustment and astigmatism correction
High speed Automatic Focus Control (AFC) and Auto Brightness & Contrast Control (ABCC) function enable faster and optimized image observation
Accelearing voltages 0,3 to 30kV
Magnification 5 to 300,000 X
Maximum Specimen size 200mm diameter
Maximum Height 80mm